67-2390-55 Electromagnetic/Eddy Current Type Film Thickness Meter (Dual Type Film Thickness Meter) with Probe SWT-NEO-FNSFN325
Features
- Set of probe SFN-325 for both body SWT-NEO
- Film thickness measurement of iron and nonferrous metal substrates is possible.
- Automatic discrimination of ferrous and non-ferrous metal substrates
Spec
- Measurement Method: Electromagnetic Induction/Eddy Current (Both)
- Measurement Range: Electromagnetic/0~3.0 mm, Eddy Current/0~2.5 mm
- Display resolution: 0.1 μm to
| Order No. | 67-2390-55 | |
|---|---|---|
| Model No. | SWT-NEO-FNSFN325 | |
| JAN Code | 4560190603963 | |
| Standard price |
JPY: 300,000
USD: 1,880.52
Excange rate 1USD= 159.53JPY
Valid price in Japan |
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| Quantity | 1set | |
| Stock in Japan |
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| Supplier Stock |
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Product Catalog
| Catalog Name | Page |
|---|---|
| AS ONE Catalog 2025 [Instruments for Laboratory] | 715 |