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• 20% off for now!! Summary
• Transistors are the foundation of device modeling.
• It starts with an explanation of the Evers-Moll Model, Gummel-Poon Model, and PSpice equivalent circuits, followed by the process of device modeling and the methodology of evaluation analysis simulation.
• Also covered as topics are thermal device modeling, power BJT, and Darlington transistors.
• Please use it to understand transistors.　
• Table of Contents
• 1.　About Device Modeling
• 2.　Device modeling
• 2.1 Introduction
• 2.2 Differences Between the Gummel-Poon and Evers-Moll Models
• 2.3 How to extract VAR
• 2.4 How to extract BR, IKF, ISC and NC
• 2.5 IS, RB Extraction Method
• 2.6 How to extract VAF
• 2.7 How to extract BF, IKF, ISE, NE, and NK
• 2.8 How to extract RC
• 2.9 How to extract CJC, VJC and MJC
• 2.10 How to extract CJE, VJE and MJE
• 2.11 How to extract TF
• 2.12 How to Extract TR
• 2.13 About Thermal Device Modeling
• 2.14 About the Power Transistor Model
• 2.15 About the Darlington Transistor Model
• Device Modeling Lab
• Device model evaluation method
• 4.1 Ic-hFE characteristics
• 4.2 Vce (sat) Voltage characteristics
• 4.3 Vbe (sat) Voltage characteristics
• 4.4 Output Characteristics
• Device Model Evaluation Circuit Simulation Lab (PSpice)
• Low-loss linear regulator circuit simulation ()
• 6.1 About Low Loss Linear Regulators
• 6.2 Concept of circuit analysis simulation
• 6.3 Embedded device model performed circuit analysis simulation
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